Texas Instruments

SN74LVTH182646APM  

Specialty Logic ICs

SN74LVTH182646APM Description

The SN74LVTH182646APM is a high-performance ABT scan test device with transceivers and registers, designed for advanced logic applications. Manufactured by Texas Instruments, this device is part of the 74LVTH series and is known for its robust performance and reliability. It operates within a supply voltage range of 2.7V to 3.6V and features 18 bits of data handling capability. The device is packaged in a 64-LQFP format and is available in tray packaging, making it suitable for surface mount applications. The SN74LVTH182646APM is REACH unaffected and RoHS3 compliant, ensuring it meets the highest environmental and safety standards. With a moisture sensitivity level (MSL) of 3 (168 hours), it is well-suited for environments where moisture resistance is critical.

SN74LVTH182646APM Features

The SN74LVTH182646APM offers several unique features that set it apart from similar models in the market:

• Advanced ABT Scan Test Capability: This feature allows for efficient and thorough testing of the device, ensuring high reliability and fault detection.
• Transceivers and Registers: The inclusion of transceivers and registers enhances data handling and processing capabilities, making it ideal for complex logic applications.
• Wide Supply Voltage Range: Operating within a 2.7V to 3.6V range, the device offers flexibility in power supply requirements.
• 18-Bit Data Handling: With the ability to handle 18 bits of data, the SN74LVTH182646APM is well-suited for applications requiring high data throughput.
• Surface Mount Compatibility: The surface mount mounting type ensures easy integration into modern PCB designs.
• Environmental Compliance: The device is REACH unaffected and RoHS3 compliant, making it suitable for environmentally conscious applications.
• Moisture Resistance: With an MSL of 3 (168 hours), the device is designed to withstand moisture, ensuring long-term reliability in various environments.

SN74LVTH182646APM Applications

The SN74LVTH182646APM is ideal for a variety of applications, including:

• High-Speed Data Processing: The device's ability to handle 18 bits of data and its wide supply voltage range make it suitable for high-speed data processing applications.
• Complex Logic Systems: The inclusion of transceivers and registers enhances its capability to manage complex logic operations, making it ideal for advanced logic systems.
• Automotive and Industrial Control: The device's robustness and environmental compliance make it suitable for automotive and industrial control applications where reliability and safety are paramount.
• Telecommunications: The SN74LVTH182646APM's high performance and data handling capabilities make it an excellent choice for telecommunications applications requiring efficient data transfer and processing.

Conclusion of SN74LVTH182646APM

The SN74LVTH182646APM from Texas Instruments is a versatile and reliable ABT scan test device with transceivers and registers. Its advanced features, including a wide supply voltage range, 18-bit data handling, and environmental compliance, make it an excellent choice for a variety of applications. Whether used in high-speed data processing, complex logic systems, automotive and industrial control, or telecommunications, the SN74LVTH182646APM offers superior performance and reliability. Its surface mount compatibility and moisture resistance further enhance its suitability for modern electronics applications.

SN74LVTH182646APM Documents

Download datasheets and manufacturer documentation for SN74LVTH182646APM

Datasheets :

SN54LVTH18(2)646A, SN74LVTH18(2)646A      

HTML Datasheet :

SN54LVTH18(2)646A, SN74LVTH18(2)646A