The SNJ54BCT8374AFK is a high-performance specialty logic IC designed by Texas Instruments, part of the 54BCT series. This device is specifically engineered for scan test applications, offering an octal D-type flip-flop configuration. It features a surface mount package, making it ideal for modern, space-efficient designs. The SNJ54BCT8374AFK operates within a supply voltage range of 4.5V to 5.5V and is designed to handle 8 bits of data, ensuring robust performance in various digital applications.
The SNJ54BCT8374AFK is particularly well-suited for applications requiring reliable and efficient scan test capabilities. Its octal D-type flip-flop configuration makes it ideal for:
The SNJ54BCT8374AFK from Texas Instruments stands out as a reliable and efficient specialty logic IC, particularly suited for scan test applications. Its surface mount design, wide supply voltage range, and 8-bit processing capability make it a versatile choice for a variety of digital systems. The device's compliance with ROHS3 standards and its non-applicable moisture sensitivity level further enhance its appeal for modern, environmentally conscious designs. Whether used in automated test equipment, industrial control systems, or telecommunications, the SNJ54BCT8374AFK offers a high level of performance and reliability, making it a top choice for engineers and designers in the electronics industry.
Download datasheets and manufacturer documentation for SNJ54BCT8374AFK