Texas Instruments_SNJ54BCT8374AFK

Texas Instruments
SNJ54BCT8374AFK  
Specialty Logic ICs

Texas Instruments
SNJ54BCT8374AFK
703-SNJ54BCT8374AFK
Ersa
Texas Instruments-SNJ54BCT8374AFK-datasheets-477191.pdf
SCAN TEST DEVICES WITH OCTAL D-T
In Stock : 1015

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SNJ54BCT8374AFK Description

SNJ54BCT8374AFK Description

The SNJ54BCT8374AFK is a high-performance specialty logic IC designed by Texas Instruments, part of the 54BCT series. This device is specifically engineered for scan test applications, offering an octal D-type flip-flop configuration. It features a surface mount package, making it ideal for modern, space-efficient designs. The SNJ54BCT8374AFK operates within a supply voltage range of 4.5V to 5.5V and is designed to handle 8 bits of data, ensuring robust performance in various digital applications.

SNJ54BCT8374AFK Features

  • Mounting Type: Surface Mount, allowing for compact and efficient integration into PCB designs.
  • Product Status: Active, ensuring availability and reliability for ongoing projects.
  • Series: 54BCT, known for its high-performance and durability in demanding environments.
  • Manufacturer: Texas Instruments, a leader in semiconductor technology, ensuring quality and innovation.
  • Supply Voltage: 4.5V to 5.5V, providing flexibility and compatibility with a wide range of power supplies.
  • Number of Bits: 8-bit processing capability, ideal for handling multiple data streams efficiently.
  • Package: Tube packaging, which simplifies handling and storage during the manufacturing process.
  • RoHS Status: ROHS3 Compliant, ensuring environmental sustainability and adherence to industry standards.
  • Moisture Sensitivity Level (MSL): Not Applicable, reducing concerns about moisture-related issues during storage and handling.

SNJ54BCT8374AFK Applications

The SNJ54BCT8374AFK is particularly well-suited for applications requiring reliable and efficient scan test capabilities. Its octal D-type flip-flop configuration makes it ideal for:

  • Automated Test Equipment (ATE): Enhancing the accuracy and speed of testing processes.
  • Digital Systems: Providing robust data handling and processing in various digital applications.
  • Industrial Control Systems: Ensuring reliable operation in environments with varying power supply conditions.
  • Telecommunications: Facilitating efficient data transmission and processing in communication systems.

Conclusion of SNJ54BCT8374AFK

The SNJ54BCT8374AFK from Texas Instruments stands out as a reliable and efficient specialty logic IC, particularly suited for scan test applications. Its surface mount design, wide supply voltage range, and 8-bit processing capability make it a versatile choice for a variety of digital systems. The device's compliance with ROHS3 standards and its non-applicable moisture sensitivity level further enhance its appeal for modern, environmentally conscious designs. Whether used in automated test equipment, industrial control systems, or telecommunications, the SNJ54BCT8374AFK offers a high level of performance and reliability, making it a top choice for engineers and designers in the electronics industry.

Tech Specifications

Operating Temperature
Logic Type
Mounting Type
Product Status
Supplier Device Package
Series
Package / Case
Mfr
Supply Voltage
Number of Bits
Package
RoHS Status
Moisture Sensitivity Level (MSL)
Category
PCB changed
HTS
ECCN (US)
PPAP
Package Length
Supplier Temperature Grade
Standard Package Name
Automotive
Pin Count
Minimum Operating Temperature (°C)
Mounting
Maximum Operating Temperature (°C)
Supplier Package
Lead Shape
Package Height
Part Status
SVHC
Maximum Operating Supply Voltage (V)
EU RoHS
Package Width
Minimum Operating Supply Voltage (V)

SNJ54BCT8374AFK Documents

Download datasheets and manufacturer documentation for SNJ54BCT8374AFK

Shopping Guide

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