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GS4A022212DAT
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GS4A022212DAT Description
GS4A022212DAT Description
The GS4A022212DAT from TT Electronics/IRC is a high-precision ceramic resistor network designed for demanding electronic applications. This 8-pin narrow SOIC device features four isolated thin-film resistors, each with a 22.1kΩ resistance and an absolute tolerance of ±0.5%, ensuring exceptional accuracy. The ±50ppm/°C temperature coefficient and 0.1W power rating per resistor (0.4W total) make it suitable for stable performance across a wide temperature range (70°C to 125°C). Encased in a rectangular ceramic SOIC package, it offers superior thermal and mechanical stability, with 100V maximum voltage rating and gull-wing terminations for reliable surface-mount assembly.
GS4A022212DAT Features
- Precision Network: Four isolated resistors with ±0.5% tolerance and ±0.05% ratio tolerance for matched performance.
- Robust Construction: Ceramic case ensures durability and thermal resistance, with 1.45mm height and 4.9mm length (tight tolerances: ±0.1mm).
- Stable Performance: ±50ppm/°C TCR and 125°C max operating temperature for reliability in harsh environments.
- Surface-Mount Ready: Gull-wing terminals with 1.27mm pitch for easy PCB integration.
- Non-Automotive: Suitable for industrial, telecom, and instrumentation applications where precision is critical.
GS4A022212DAT Applications
This resistor network excels in:
- Precision voltage dividers and signal conditioning circuits in test equipment.
- Isolated feedback networks for op-amps and ADCs in industrial control systems.
- High-reliability medical devices requiring stable resistance over temperature.
- Telecom infrastructure, where low TCR and tight tolerance minimize drift.
Conclusion of GS4A022212DAT
The GS4A022212DAT stands out for its ceramic-based isolation, thin-film accuracy, and industrial-grade robustness. While not PPAP or automotive-qualified, its low TCR, tight tolerances, and compact SOIC package make it ideal for precision analog designs. Engineers will appreciate its balance of performance, size, and reliability in critical applications.



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