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4309R-101-333LF

4309R-101-333LF Description

The 4309R-101-333LF from Bourns Inc. is an 8-resistor bussed network array housed in a compact 9-pin SIP package. Designed for through-hole mounting, it features a 33kΩ resistance per element with a tight ±2% tolerance, ensuring reliable performance in precision circuits. The array operates within a ±100ppm/°C temperature coefficient and offers a 50ppm/°C resistor-ratio drift, making it stable under thermal variations. With a 200mW power rating per resistor and a 4.95mm max seated height, it balances power handling and space efficiency. Compliant with ROHS3 and REACH, it meets stringent environmental standards while being packaged in tubes for easy handling.

4309R-101-333LF Features

• High-Density Integration: 8 resistors in a 22.45mm × 2.16mm footprint, reducing PCB space.
• Stable Performance: Low ±100ppm/°C TCR and 50ppm/°C ratio drift ensure consistency across temperature fluctuations.
• Robust Construction: Through-hole design with 200mW power dissipation per element for durability.
• Compliance: ROHS3 and REACH certified, suitable for eco-conscious designs.
• Bussed Circuit: Simplified routing for common-node applications, reducing wiring complexity.

4309R-101-333LF Applications

Ideal for voltage division, pull-up/pull-down networks, and signal conditioning in:

• Industrial Controls: PLCs and sensor interfaces requiring stable resistance ratios.
• Consumer Electronics: Audio equipment and display drivers where space is constrained.
• Automotive Systems: ECU and lighting circuits demanding thermal stability.
• Test & Measurement: Precision instrumentation needing low drift.

Conclusion of 4309R-101-333LF

The 4309R-101-333LF excels in applications demanding compactness, thermal reliability, and ease of integration. Its bussed architecture and tight tolerance make it superior to discrete resistors in multi-channel designs, while compliance with environmental standards ensures global usability. A versatile choice for engineers prioritizing performance and space optimization.