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M29F400FT55N3E2

M29F400FT55N3E2 Description

The M29F400FT55N3E2 is a 4Mbit Flash memory IC chip designed by Micron Technology, Inc. This device is characterized by its parallel memory interface and is available in a surface mount package, making it suitable for modern, space-efficient electronic designs. The M29F400FT55N3E2 features a memory organization of 512K x 8 or 256K x 16, providing flexibility in data storage configurations. It operates within a supply voltage range of 4.5V to 5.5V and offers an access time of 55 nanoseconds, ensuring rapid data retrieval. The write cycle time for both word and page operations is also 55 nanoseconds, contributing to its high-performance capabilities. The device is packaged in a tray format and has a moisture sensitivity level (MSL) of 3, which allows for 168 hours of exposure before assembly. While this product is marked as obsolete, it remains a reliable option for legacy systems and specific applications that require its unique specifications.

M29F400FT55N3E2 Features

• Memory Size and Organization: The M29F400FT55N3E2 provides a total memory size of 4Mbit, organized as 512K x 8 or 256K x 16. This configuration offers versatility in data storage, making it suitable for a variety of applications that require different data width configurations.
• Parallel Interface: The parallel memory interface ensures high-speed data transfer, which is crucial for applications that demand rapid access to large amounts of data.
• Fast Access and Write Times: With an access time of 55 nanoseconds and a write cycle time of 55 nanoseconds for both word and page operations, the M29F400FT55N3E2 delivers quick and efficient performance, minimizing latency in data processing.
• Wide Supply Voltage Range: The device operates within a supply voltage range of 4.5V to 5.5V, providing flexibility in power supply requirements and ensuring compatibility with various electronic systems.
• Surface Mount Packaging: The surface mount package type allows for easy integration into modern PCB designs, contributing to compact and efficient electronic assemblies.
• Moisture Sensitivity Level (MSL) 3: The MSL rating of 3 (168 hours) ensures that the device can withstand a reasonable amount of exposure to moisture before assembly, enhancing its reliability in different manufacturing environments.
• Compliance and Status: The M29F400FT55N3E2 is REACH unaffected and RoHS3 compliant, meeting environmental and safety standards for electronic components. It is also classified under HTSUS code 8542.32.0071.

M29F400FT55N3E2 Applications

The M29F400FT55N3E2 is ideal for applications that require high-speed data access and storage in a compact form factor. Some specific use cases include:

• Embedded Systems: The fast access and write times make it suitable for embedded systems where quick data retrieval and storage are critical.
• Industrial Control Systems: The robustness and reliability of the device, combined with its surface mount packaging, make it a good fit for industrial control systems that operate in harsh environments.
• Telecommunications: The high-speed parallel interface and large memory size are beneficial for telecommunications equipment that requires efficient data handling.
• Consumer Electronics: The compact size and surface mount package are advantageous for consumer electronics where space is a premium, such as in gaming consoles, digital cameras, and other portable devices.

Conclusion of M29F400FT55N3E2

The M29F400FT55N3E2, despite being marked as obsolete, remains a valuable component for specific applications due to its unique combination of high-speed performance, flexible memory organization, and robust packaging. Its fast access and write times, coupled with a wide supply voltage range and compliance with environmental standards, make it a reliable choice for legacy systems and specialized designs. For engineers and designers working on projects that require a 4Mbit Flash memory IC with a parallel interface, the M29F400FT55N3E2 offers a proven solution that balances performance, reliability, and compatibility.