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Texas Instruments
SNJ54BCT8240AFK
703-SNJ54BCT8240AFK
PDF Datasheet
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
18 weeks
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Tech Specifications
High Level Output Current
-12mA
Lead Free
Contains Lead
Logic Function
Buffer
Low Level Output Current
48mA
Max Operating Temperature
125°C
Min Operating Temperature
-55°C
Max Supply Voltage
5.5V
Min Supply Voltage
4.5V
SNJ54BCT8240AFK Description
Scan Test Device with Inverting Buffers IC 28-LCCC (11.43x11.43)
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