Texas Instruments_SNJ54BCT8373AJT
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Texas Instruments
SNJ54BCT8373AJT

703-SNJ54BCT8373AJT
PDF Datasheet
Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125
18 weeks

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Tech Specifications

Package/Case
CDIP
High Level Output Current
-12mA
Lead Free
Contains Lead
Low Level Output Current
48mA
Max Operating Temperature
125°C
Min Operating Temperature
-55°C
Max Supply Voltage
5.5V
Min Supply Voltage
4.5V
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SNJ54BCT8373AJT Description

SNJ54BCT8373AJT Description

The SNJ54BCT8373AJT is a high-performance logic IC chip designed for scan test applications, manufactured by Texas Instruments. This device is part of the 54BCT series and is known for its robustness and reliability in various electronic systems. It features an 8-bit octal D-type flip-flop with scan test capabilities, making it ideal for complex digital circuits that require thorough testing and validation.

SNJ54BCT8373AJT Features

  • Mounting Type: Through Hole, ensuring secure and stable integration into printed circuit boards.
  • Product Status: Active, indicating that this product is currently in production and readily available for purchase.
  • Series: 54BCT, a series renowned for its high-speed performance and compatibility with a wide range of applications.
  • Manufacturer: Texas Instruments, a leading global semiconductor company known for its innovative and high-quality products.
  • Supply Voltage: Operates within a range of 4.5V to 5.5V, providing flexibility and compatibility with various power supply configurations.
  • Number of Bits: 8-bit octal D-type flip-flop, offering efficient data handling and processing capabilities.
  • Package: Tube packaging, which is ideal for bulk handling and storage, ensuring the devices remain protected during transportation and assembly.
  • RoHS Status: ROHS3 Compliant, meeting stringent environmental standards and ensuring the product is free from hazardous substances.
  • Moisture Sensitivity Level (MSL): Not Applicable, indicating that the device does not require special handling or storage conditions related to moisture sensitivity.

SNJ54BCT8373AJT Applications

The SNJ54BCT8373AJT is particularly well-suited for applications that require reliable and efficient scan test capabilities. Its 8-bit octal D-type flip-flop design makes it ideal for:

  • Complex Digital Systems: Where thorough testing and validation are essential to ensure system integrity and functionality.
  • Automated Test Equipment (ATE): Used in the development and production of electronic devices to ensure quality and reliability.
  • Industrial Control Systems: Where robust and reliable digital circuits are required to manage and monitor industrial processes.
  • Telecommunications: In equipment that requires high-speed data processing and reliable performance under varying operating conditions.

Conclusion of SNJ54BCT8373AJT

The SNJ54BCT8373AJT from Texas Instruments stands out as a reliable and efficient solution for scan test applications. Its robust design, compatibility with a wide range of supply voltages, and compliance with environmental standards make it a preferred choice for engineers and designers in the electronics industry. Whether used in complex digital systems, automated test equipment, industrial control systems, or telecommunications, the SNJ54BCT8373AJT delivers consistent performance and reliability. Its through-hole mounting type and tube packaging ensure ease of integration and handling, making it a versatile component for various applications.

FAQ

What voltage specification is listed for SNJ54BCT8373AJT?
The listed voltage-related specification for SNJ54BCT8373AJT is 5.5V.
What is the standard lead time for SNJ54BCT8373AJT?
Is SNJ54BCT8373AJT currently in stock?
Are there related or alternative parts for SNJ54BCT8373AJT?
What is SNJ54BCT8373AJT?
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