Texas Instruments_SNJ54BCT8374AJT
original

Texas Instruments
SNJ54BCT8374AJT

703-SNJ54BCT8374AJT
PDF Datasheet
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125
18 weeks

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APAC
ISO9001
Quality Policy
ISO45001
ISO14001
Original

Tech Specifications

Package/Case
CDIP
Clock Edge Trigger Type
Positive Edge
Frequency
70MHz
High Level Output Current
-12mA
Lead Free
Contains Lead
Logic Function
D-Type
Low Level Output Current
48mA
Max Operating Temperature
125°C
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SNJ54BCT8374AJT Description

Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-CDIP

FAQ

What is the standard lead time for SNJ54BCT8374AJT?
The standard lead time for SNJ54BCT8374AJT is 18 weeks.
What package or case is SNJ54BCT8374AJT available in?
What operating temperature range does SNJ54BCT8374AJT support?
What is the mounting type of SNJ54BCT8374AJT?
Is SNJ54BCT8374AJT currently in stock?
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