Texas Instruments
SNJ54BCT8374AJT
703-SNJ54BCT8374AJT
PDF Datasheet
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125
18 weeks
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Tech Specifications
Package/Case
CDIP
Clock Edge Trigger Type
Positive Edge
Frequency
70MHz
High Level Output Current
-12mA
Lead Free
Contains Lead
Logic Function
D-Type
Low Level Output Current
48mA
Max Operating Temperature
125°C
SNJ54BCT8374AJT Description
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-CDIP
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